This module implements
methods to detect patterns in image regions. Commonly, classification
algorithms are divided by the level of classification (pixel or
region), and by the interaction of the user (supervised or
unsupervised). Pixel-based
algorithms classify individual pixels according to their resemblance
to a specific pattern. Region-based
algorithms use regions from segmented images, and classify each
region to a specific pattern. Supervised
methods uses a predefined typology, given by the user, who supplies
samples of each pattern. Unsupervised
methods detect an unknown number of
patterns, according to their own method.
The available
methods in TerraLib are:
ISOSeg,
Expectation-Maximization - EM,
K-Means,
Spectral Angle Mapper - SAM,
Maximum a Posteriori Probability - MAP.
Input:
Raster
Vector of polygons
Acceptance threshold
This is an unsupervised and pixel-based classification algorithm. Expectation-Maximization (EM) works iteratively by applying two steps: the E-step (Expectation) and the M-step (Maximization).
Input:
Raster
The value of “K”, which stands for the number of patterns (or clusters) to find in the image.
The maximum number of iterations (E/M steps) to perform if convergence is not achieved.
The maximum number of points used to estimate the clusters (default = 1000).
A convergence threshold. When the clusters change in a value smaller then epsilon, the convergence is achieved.
The previously estimated means of the clusters (optional).
This is an unsupervised and pixel-based classification algorithm.
Input:
Raster
The value of “K”, which stands for the number of patterns to find in the image.
A convergence threshold. When the clusters move less than this threshold, the algorithm stops.
Maximum number of iterations.
Input:
Raster
A set of ROI samples.
Raster
A set of ROI samples.
Raster
A set of ROI samples.
Parameters:
Apply ICM: Enable/disable the use of Iterated Conditional Modes (ICM) after the maximum likelihood estimation.
Maximum of iterations: Maximum number of ICM iterations to perform.
Iterations Threshold: Minimum number of changed pixels (percentage) between iterations. If the number of changed pixels is below this value the process is stopped.
References:
On the Statistical Analysis of Dirty Pictures - Julian Besag - Journal of the Royal -Statistical Society. Series B (Methodological), Vol. 48, No. 3. (1986), pp. 259-302.
ERTHAL, G.J.; FRERY, A.C. Segmentação de imagens multiespectrais pelo algoritmo Icm: Integração ao ambiente spring. In: SIMPÓSIO BRASILEIRO DE COMPUTAÇÃO GRÁFICA E PROCESSAMENTO DE IMAGENS, 6., 1993, Recife Anais...Recife. SIBRAPI, 1993. p.33-36.
It
is accessible through:
Raster
Processing > Classification... (list
of all raster layers will be available)
This wizard
consists of the following steps:
On the List of Layers select the raster layer to apply the operation.
Optionally use Filter By Name field giving part of the layer name to help find the layer in the list.
Press Next to go to next step or Cancel to close the dialog.
Select the type of classifier to be used.
Select the bands to be used in the process.
As described above, each classifier has a set of specific attributes. For supervised classifiers (SAM and MAP) is necessary to use a component for the acquisition of samples.
Use tool to enable the acquisition of components (samples) through the interface Raster Navigator. This interface offers several tools (such as zoom, color composition) to help on collecting good samples.
Use tool to create a region of interest over the image that represents a homogeneous region of a desired sample.
Press Next to go to next step, Back to return to the previous wizard or Cancel to close the dialog.
Raster Info - First press and inform the folder where the resulting file will be saved.
Name - inform the raster name.
Extra Parameters - if there are some, see the details on how to inform then here.
Press Finish to save the resulting contrasted raster or Back to go to the previous wizard page.
Hint: The resulting image will be added as a new layer at the TerraView project.